ISSN 2196-5625 CN 32-1884/TK
1.State Key Laboratory of Advanced Electromagnetic Engineering and Technology, and School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China;2.Department of Electronic and Electrical Engineering, University of Strathclyde, Glasgow G11XW, U.K.
This work was supported in part by the National Key Research and Development Program of China (No. 2023YFB2406600), the Joint Funds of the National Natural Science Foundation of China (No. U22A6007), and the National Science Fund for Excellent Young Scholars of China (No. 52222703).
