ISSN 2196-5625 CN 32-1884/TK
Shengyuan Liu
School of Electrical Engineering, Zhejiang University, Hangzhou 310027, China;Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, TN 37996, USATianhan Zhang
School of Electrical Engineering, Zhejiang University, Hangzhou 310027, ChinaZhenzhi Lin
School of Electrical Engineering, Zhejiang University, Hangzhou 310027, China;School of Electrical Engineering, Shandong University, Jinan 250061, ChinaYilu Liu
Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, TN 37996, USA;Electrical and Electronics Systems Research Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USAYi Ding
School of Electrical Engineering, Zhejiang University, Hangzhou 310027, ChinaLi Yang
School of Electrical Engineering, Zhejiang University, Hangzhou 310027, China1.School of Electrical Engineering, Zhejiang University, Hangzhou 310027, China;2.Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, TN 37996, USA;3.School of Electrical Engineering, Shandong University, Jinan 250061, China;4.Electrical and Electronics Systems Research Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
This work was supported by the National Natural Science Foundation of China (No. 51777185), National Key R&D Program of China (No. 2016YFB0900100), and Zhejiang University Academic Award for Outstanding Doctoral Candidates.