ISSN 2196-5625 CN 32-1884/TK
Qingyu Tu
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security ;High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, ChinaShihong Miao
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security ;High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, ChinaFuxing Yao
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security ;High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, ChinaYaowang Li
Department of Electrical Engineering, Tsinghua University, Beijing, ChinaHaoran Yin
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security ;High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, ChinaJi Han
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security ;High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, ChinaDi Zhang
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security ;High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, ChinaWeichen Yang
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security ;High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China1.State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security ;2.High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China;3.Department of Electrical Engineering, Tsinghua University, Beijing, China
This work was supported by the National Key Research and Development Program of China (No. 2017YFB0902600).