ISSN 2196-5625 CN 32-1884/TK
Yue Yin
Department of Electrical Engineering, Sichuan University, Chengdu 610065, ChinaTianqi Liu
Department of Electrical Engineering, Sichuan University, Chengdu 610065, ChinaLei Wu
Department of Electrical and Computer Engineering, Stevens Institute of Technology, Hoboken, NJ 07030, USAChuan He
Department of Electrical Engineering, Sichuan University, Chengdu 610065, ChinaYikui Liu
Department of Electrical and Computer Engineering, Stevens Institute of Technology, Hoboken, NJ 07030, USA1.Department of Electrical Engineering, Sichuan University, Chengdu 610065, China;2.Department of Electrical and Computer Engineering, Stevens Institute of Technology, Hoboken, NJ 07030, USA
This work was supported by the National Natural Science Foundation of China (No. 52007125).