ISSN 2196-5625 CN 32-1884/TK
Nan Lu
Electrical Engineering, Sichuan University, Chengdu, China;Department of Electrical and Computer Engineering, Stevens Institute of Technology, Hoboken, NJ 07901, USAYikui Liu
Department of Electrical and Computer Engineering, Stevens Institute of Technology, Hoboken, NJ 07901, USAWu Lei
Department of Electrical and Computer Engineering, Stevens Institute of Technology, Hoboken, NJ 07901, USATianqi Liu
Electrical Engineering, Sichuan University, Chengdu, ChinaChuan He
Electrical Engineering, Sichuan University, Chengdu, China1.Electrical Engineering, Sichuan University, Chengdu, China;2.Department of Electrical and Computer Engineering, Stevens Institute of Technology, Hoboken, NJ 07901, USA