Journal of Modern Power Systems and Clean Energy

ISSN 2196-5625 CN 32-1884/TK

Evaluation Method and Probabilistic Index of Voltage Sag Severity Considering Point-on-wave
Author:
Affiliation:

1.Guangzhou Power Supply Bureau Cooperation, Guangzhou, China;2.School of Electric Power, South China University of Technology, Guangzhou, China

Fund Project:

This work was supported by China Southern Power Grid (No. GZHKJXM20170141).

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
    Abstract:

    The impact of voltage sag on sensitive devices is related to the time when the sag occurs. However, the point-on-wave of a sag is uncertain. Therefore, this paper presents a novel approach to evaluate the voltage sag severity considering a random point-on-wave. First, the uncertainty of equipment malfunction is revealed. Second, under a given residual voltage, the relationship between the point-on-wave and the duration that the device can withstand is described with a fitting curve. Third, a voltage sag probabilistic index is proposed to describe the severity. The evaluation procedure is also presented. Finally, three types of releasers are tested and analyzed to determine the effectiveness of the proposed method. The evaluation method can help instruct electrical engineers establish more well-grounded sag mitigation proposals.

    表 1 Table 1
    图1 Diagram of VTCs.Fig.1
    图2 Estimation of uncertainty region. (a) Under-estimation of uncertainty region. (b) Over-estimation of uncertainty region.Fig.2
    图3 Evaluation procedure of voltage sag severity.Fig.3
    图4 VTCs of tested releasers at different points-on-wave. (a) VTCs of C20. (b) VTCs of C32. (c) VTCs of C50.Fig.4
    图5 Point-on-wave and duration threshold curve under 30% residual voltage.Fig.5
    图6 IP with 30% residual voltage (uniform distribution).Fig.6
    图7 IP with 30% residual voltage (normal distribution).Fig.7
    Fig.
    Reference
    Related
    Cited by
Get Citation
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:July 13,2019
  • Online: May 19,2021